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Departments: Supersizing with SPC

Statistical Process Control (SPC) was initially developed over 65 years ago by Walter A. Shewhart as a method to improve or achieve quality control in a manufacturing process. In this method, statistical tools like frequency distribution, histograms, scatter diagrams and Pareto charts are used to view and reduce process variation, thereby reducing defects and waste from the production line. Although SPC is a cost-effective and thorough method of determining and predicting significant deviations in a...

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December/January 2015

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